“電子元件”相關(guān)標(biāo)準(zhǔn)目錄

1 GB/T 1772-1979 電子元器件失效率試驗(yàn)方法 Determination of failure rate of electronic elements and components
2 GB/T 2036-1994 印制電路術(shù)語 Terms for printed circuits
3 GB/T 2413-1980 壓電陶瓷材料體積密度測量方法 Piezoelectric ceramic materials--Measuring methods for determination of volume density
4 GB/T 2470 -1995 電子設(shè)備用固定電阻器、固定電容器型號(hào)命名方法  Type designation system for fixed resistors and fixed capacitors for use in electronic equipment
5 GB/T 2471-1995 電阻器和電容器優(yōu)先數(shù)系 Preferred number series for resistors and capacitors
6 GB/T 2472-1981 電子設(shè)備用固定式電容器工作電壓系列 Fixed capacitors for electronic equipments--Working voltage series
7 GB/T 2473 -1981 電子設(shè)備用矩形金屬外殼電容器外形尺寸系列  Capacitors with rectangular metal enclosure for electronic equipments--Outline dimensions series
8 GB/T 2474-1981 電子設(shè)備用圓形金屬外殼電容器外形尺寸系列  Capacitors with disc metal enclosure for electronic equipments--Outline dimensions series
9 GB/T 2658-1995 小型交流風(fēng)通用機(jī)技術(shù)條件 A.C. miniature blowers, general specification for
10 GB/T 2693-1990 電子設(shè)備用固定電容器 第一部分: 總規(guī)范 (可供認(rèn)證用) Fixed capacitors for use in electronic equipment-Part 1: Generic specification
11 GB/T 2775-1993 手控電子元件的軸端尺寸 Dimensions of spendle ends for manually operated electronic components
12 GB/T 3351-1982 人造石英晶體的型號(hào)命名 Designations for synthetic quartz crystals
13 GB/T 3388-1982 壓電陶瓷材料型號(hào)命名方法 Designations for types of piezoelectric ceramics
14 GB/T 3389.3 -1982 壓電陶瓷材料性能測試方法 居里溫度Tc的測試  Test methods for the properties of piezoelectric ceramics--Test for Curie temperature Tc
15 GB/T 3389.4-1982 壓電陶瓷材料性能測試方法 柱體縱向長度伸縮振動(dòng)模式  Test methods for the properties of piezoelectric ceramics--Longitudinal length extension vibration mode for rod
16 GB/T 3389.7-1986 壓電陶瓷材料性能測試方法 強(qiáng)場介電性能的測試  Test methods for the properties of piezoelectric ceramics--Test for dielectric properties in high electric field
17 GB/T 3389.8-1986 壓電陶瓷材料性能測試方法 熱釋電系數(shù)的測試  Test methods for the properties of piezoelectric ceramics--Test for the pyroelectric coefficient
18 GB/T 3664-1986 電容器非線性測量方法 Method of measurement of non-linearity in capacitors
19 GB/T 3788-1995 真空電容器通用技術(shù)條件 General specification for vacuum capacitors
20 GB/T 4071-1983 光致熒光粉測試方法 Measuring method for the phosphor excited by light
21 GB/T 4072-1983 陰極射線致熒光粉測試方法 Measuring method of the phosphor excited by cathode rays
22 GB/T 4098.1-1983 射頻電纜電暈試驗(yàn)方法 Test method of corona for radio-frequency cables
23 GB/T 4098.2 -1983 射頻電纜電容和電容不平衡測量方法  Methods of measurement of capacitance and capacitance unbalance for radio-frequency cables
24 GB/T 4098.3-1983 射頻電纜特性阻抗測量方法 Methods of measurement of characteristic impedance for radio-frequency cables
25 GB/T 4098.4-1983 射頻電纜衰減常數(shù)測量方法 Methods of measurement of attenuation constant for radio-frequency cables
26 GB/T 4098.5-1983 射頻電纜電容穩(wěn)定性試驗(yàn)方法 Test method of capacitance stability for radio-frequency cables
27 GB/T 4098.6-1983 射頻電纜衰減穩(wěn)定性試驗(yàn)方法 Test method of attenuation stability for radio-frequency cables
28 GB/T 4098.7-1983 射頻電纜高溫試驗(yàn)方法 Test method of high-temperature for radio-frequency cables
29 GB/T 4098.8-1983 射頻電纜低溫試驗(yàn)方法 Test method of low-temperature for radio-frequency cables
30 GB/T 4098.9-1983 射頻電纜流動(dòng)性試驗(yàn)方法 Test method of flow for radio-frequency cables
31 GB/T 4098.10-1983 射頻電纜尺寸穩(wěn)定性試驗(yàn)方法 Test method of dimensional stability for radio-frequency cables
32 GB/T 4165-1984 電子設(shè)備用可變電容器的使用導(dǎo)則 Guide to the use of variable {{分頁}}capacitors in electronic equipment
33 GB/T 4166-1984 電子設(shè)備用可變電容器的試驗(yàn)方法 Methods of test of variable capacitors in electronic equipment
34 GB/T 4210-1984 電子設(shè)備用機(jī)電元件名詞術(shù)語 Terms of electromechanical components for electronic equipment
35 GB/T 4475-1995 敏感元器件術(shù)語 Terms of sensor
36 GB/T 4588.1-1996 無金屬化孔單雙面印制板分規(guī)范 Sectional specification: single and double sided printed boards with plain holes
37 GB/T 4588.2-1996 有金屬化孔單雙面印制板分規(guī)范 Sectional specification: single and double sided printed boards with plated-through holes
38 GB/T 4588.3-1988 印制電路板設(shè)計(jì)和使用 Design and use of printed boards
39 GB/T 4588.4-1996 多層印制板 分規(guī)范 Sectional specification--Multilayer printed boards
40 GB/T 4588.10 -1995 印制板 第10部分: 有貫穿連接的剛撓雙面印制板規(guī)范 Printed boards--Part 10:  Specification for flex-rigid double-sided printed boards with through connections
41 GB/T 4596-1984 電子設(shè)備用三相變壓器形鐵心 E-cores for three-phase transformers for use in electronic equipment
42 GB/T 4677.1-1984 印制板表層絕緣電阻測試方法 Test method of surface insulation resistance for printed boards
43 GB/T 4677.2 -1984 印制板金屬化孔鍍層厚度測試方法 微電阻法 Micro- resistance test method of plating thickness of platedthrough holes for printed boards
44 GB/T 4677.3-1984 印制板拉脫強(qiáng)度測試方法 Test methods of pull strength for printed boards
45 GB/T 4677.4-1984 印制板抗剝強(qiáng)度測試方法 Test methods of peel strength for printed boards
46 GB/T 4677.5-1984 印制板翹曲度測試方法 Test methods of platness for printed boards
47 GB/T 4677.6 -1984 金屬和氧化覆蓋層厚度測試方法 截面金相法  Test methods for thickness of metal and oxide coating by microscopical examination of cross-section
48 GB/T 4677.7-1984 印制板鍍層附著力試驗(yàn)方法 膠帶法 Test method of plating adhesion by adhesive type for printed boards
49 GB/T 4677.8 -1984 印制板鍍涂覆層厚度測試方法 β反向散射法  Test method of plating and coating thickness by beta backscattering for printed boards
50 GB/T 4677.9-1984 印制板鍍層孔隙率電圖象測試方法 The electrographic test method of plating porosity for printed boards
51 GB/T 4677.10-1984 印制板可焊性測試方法 Test method of solderability for printed boards
52 GB/T 4677.11-1984 印制板耐熱沖擊試驗(yàn)方法 Test methods of thermal shock for printed boards
53 GB/T 4677.12-1988 印制板互連電阻測試方法 Test method of interconnection resistance for printed boards
54 GB/T 4677.13 -1988 印制板金屬化孔電阻的變化 熱循環(huán)測試方法 Test method of change in resistance of plated -through holes--Thermal cycling for printed boards
55 GB/T 4677.14-1988 印制板蒸汽-氧氣加速老化試驗(yàn)方法 Test method of steam/oxygen accelerated ageing of printed board
56 GB/T 4677.15-1988 印制板絕緣涂層耐溶劑和耐焊劑試驗(yàn)方法 Test method for solvent and flux resistance of insulating coating on printed boards
57 GB/T 4677.16-1988 印制板一般檢驗(yàn)方法 General examination method for printed boards
58 GB/T 4677.17-1988 多層印制板內(nèi)層絕緣電阻測試方法 Test method for insulation resistance within inner layers of multilayer printed boards
59 GB/T 4677.18-1988 多層印制板層間絕緣電阻測試方法 Test method for insulation resistance between layers of multilayer printed boards
60 GB/T 4677.19-1988 印制板電路完善性測試方法 Test method for electrical integrity of printed boards
61 GB/T 4677.20-1988 印制板鍍層附著性試驗(yàn)方法 摩擦法 Test method for plating adhesion of printed boards--Burnishing
62 GB/T 4677.21-1988 印制板鍍層孔隙率測試方法 氣體暴露法 Test method for plating porosity of printed boards--The gas exposure method
63 GB/T 4677.22-1988 印制板表面離子污染測試方法 Test method for surface ionic contamination of printed boards
64 GB/T 4677.23-1988 印制板阻燃性能測試方法 Test method for flammability of printed boards
65 GB/T 4721-1992 印制電路用覆銅箔層壓板通用規(guī)則 General rules for copper-clad laminated sheets for printed circuits
66 GB/T 4722-1992 印制電路用覆銅箔層壓板試驗(yàn)方法 Test methods for copper-clad laminated sheets for printed circuits
67 GB/T 4723-1992 印制電路用覆銅箔酚醛紙層壓板 Phenolic cellulose paper copper-clad laminated sheets for printed circuits
68 GB/T 4724-1992 印制電路用覆銅箔環(huán)氧紙層壓板 Epoxide cellulose paper copper-clad laminated sheets for printed circuits
69 GB/T 4725-1992 印制電路用覆銅箔環(huán)氧玻璃布層壓板 Epoxide woven glass fabric copper-clad laminated sheets for printed circuits
70 GB/T 4779.1-1984 彩色顯象管用熒光粉Y22-G3熒光粉 Phosphors for color picture tubes use--Phosphor Y22-G3
71 GB/T 4779.2-1984 彩色顯象管用熒光粉Y22-B2熒光粉 Phosphors for color picture tubes use--Phosphor Y22-B2
72 GB/T 4779.3-1984 彩色顯象管用熒光粉Y22-R4熒光粉 Phosphors for color picture tubes use--Phosphor Y22-R4
73 GB/T 4825.1-1984 印制板導(dǎo)線局部放電測試方法 Test method for partial discharge of conductors on printed boards
74 GB/T 4825.2-1984 印制板導(dǎo)線載流量測試方法 Test method for current carrying capacity of conductors on printed boards
75 GB/T 4874-1985 直流固定金屬化紙介電容器總規(guī)范 Generic specification for fixed metallized paper dielectric capacitors for direct current
76 GB/T 5076-1985 具有兩個(gè)軸向引出端的圓柱體元件的尺寸測量 Measurement of the dimensions of a cylindrical component having two axial terminations
77 GB/T 5077-1985 電容器和電阻器的最大外形尺寸 Maximum case dimensions for capacitors and resistors
78 GB/T 5078 -1985 單向引出的電容器和電阻器所需空間的測定方法  Method for the determination of the space required by capacitors and resistors with unidirectional terminations
79 GB/T 5489-1985 印制板制圖 Printed board drawing
80 GB/T 5594.1-1985  電子元器件結(jié)構(gòu)陶瓷材料性能測試方法 氣密性測試方法  Test methods for properties of structure ceramic used in electronic components--Test method for gas-tightness
81 GB/T 5594.2-1985 電子元器件結(jié)構(gòu)陶瓷材料性能測試方法 楊氏彈性模量、泊松比測試方法  Test methods for properties of structure ceramic used in electronic components--Test method for Youngs elastic modulus and Poisson ratio
82 GB/T 5594.3-1985 電子元器件結(jié)構(gòu)陶瓷材料性能測試方法 平均線膨脹系數(shù)測試方法  Test methods for properties of structure ceramic used in electronic components--Test method for mean coefficient of linear expansion
83 GB/T 5594.4-1985 電子元器件結(jié)構(gòu)陶瓷材料性能測試方法 介質(zhì)損耗角正切值的測試方法  Test methods for properties of structure ceramic used in electronic components--Test method for dielectric loss angle tangent value
84 GB/T 5594.5-1985 電子元器件結(jié)構(gòu)陶瓷材料性能測試方法 體積電阻率測試方法  Test methods for properties of structure ceramic used in electronic components--Test method for volume resistivity {{分頁}}
85 GB/T 5594.6-1985 電子元器件結(jié)構(gòu)陶瓷材料性能測試方法 化學(xué)穩(wěn)定性測試方法  Test methods for properties of structure ceramic used in electronic components--Test method for chemical durability
86 GB/T 5594.7-1985 電子元器件結(jié)構(gòu)陶瓷材料性能測試方法 透液性測定方法  Test methods for properties of structure ceramic used in electronic components--Test method for liquid permeability
87 GB/T 5594.8-1985 電子元器件結(jié)構(gòu)陶瓷材料性能測試方法 顯微結(jié)構(gòu)的測定  Test methods for properties of structure ceramic used in electronic components--Determination of microstructure
88 GB/T 5598-1985 氧化鈹瓷導(dǎo)熱系數(shù)測定方法 Test method for thermal conductivity of beryllium oxide ceramics
89 GB/T 5729-1994 電子設(shè)備用固定電阻器 第一部分: 總規(guī)范 Fixed resistors for use in electronic equipment--Part 1: Generic specification
90 GB/T 5730 -1985 電子設(shè)備用固定電阻器 第二部分: 分規(guī)范: 低功率非線繞固定電阻器 (可供認(rèn)證用)  Fixed resistors for use in electronic equipment--Part 2: Sectional specification: Fixed low-power non-wire wound resistors
91 GB/T 5731-1985 電子設(shè)備用固定電阻器 第二部分: 空白詳細(xì)規(guī)范: 低功率非線繞固定電阻器評定水平E (可供認(rèn)證用)  Fixed resistors for use in electronic equipment--Part 2: Blank detail specification: Fixed low-power non-wire wound resistors--Assessment level E
92 GB/T 5732-1985 電子設(shè)備用固定電阻器 第四部分: 分規(guī)范: 功率型固定電阻器(可供認(rèn)證用)  Fixed resistors for use in electronic equipment--Part 4: Sectional specification: Fixed power resistors
93 GB/T 5733-1985 電子設(shè)備用固定電阻器 第四部分: 空白詳細(xì)規(guī)范: 功率型固定電阻器 評定水平E (可供認(rèn)證用)  Fixed resistors for use in electronic equipment--Part 4: Blank detail specification: Fixed power resistors Assessment level E
94 GB/T 5734-1985 電子設(shè)備用固定電阻器 第五部分: 分規(guī)范: 精密固定電阻器 (可供認(rèn)證用)  Fixed resistors for use in electronic equipment--Part 5: Sectional specification: Fixed precision resistors
95 GB/T 5735-1985 電子設(shè)備用固定電阻器 第五部分: 空白詳細(xì)規(guī)范: 精密固定電阻器 評定水平E (可供認(rèn)證用)  Fixed resistors for use in electronic equipment--Part 5: Blank detail specification: Fixed precision resistors--Assessment level E
96 GB/T 5838-1986 熒光粉名詞術(shù)語 Terms for phosphors
97 GB/T 5966-1996  電子設(shè)備用固定電容器 第8部分: 分規(guī)范: 1類瓷介固定電容器  Fixed capacitors for use in electronic equipment--Part 8: Sectional specification: Fixed capacitors of ceramic dielectric, class 1
98 GB/T 5967-1996 電子設(shè)備用固定電容器 第8部分: 空白詳細(xì)規(guī)范 1類瓷介固定電容器 評定水平 E Fixed capacitors for use in electronic equipment--Part 8: Blank detail specification Fixed capacitors of ceramic dielectric, class 1--Assessment level E
99 GB/T 5968-1996 電子設(shè)備用固定電容器 第9部分: 分規(guī)范 2類瓷介固定電容器  Fixed capacitors for use in electronic equipment--Part 9: Sectional specification Fixed capacitors of ceramic dielectric, class 2
100 GB/T 5969-1996 電子設(shè)備用固定電容器 第9部分: 空白詳細(xì)規(guī)范 2類瓷介電容器 評定水平  E Fixed capacitors for use in electronic equipment--Part 9: Blank detail specification Fixed capacitor of ceramic dielectric, class 2 --Assessment level E

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