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EEPW首頁(yè) > 模擬技術(shù) > 設(shè)計(jì)應(yīng)用 > 接口數(shù)控端口和電阻激光驅(qū)動(dòng)器-Interfacing Dig

接口數(shù)控端口和電阻激光驅(qū)動(dòng)器-Interfacing Dig

作者： 時(shí)間：2011-04-13 來源：網(wǎng)絡(luò) 收藏
ters in the application. The DS1847 resistor value is characterized at various temperatures in the Dallas factory. The result fits into an equation, whose coefficients are stored in registers for use during calibration at the customer site (refer to Application Note 167).

To illustrate some of the concepts described in the previous paragraph, Figures 4a, 4b, and 4c show typical characteristics in lasers and photodiodes after they are temperature compensated with look-up tables.

接口數(shù)控端口和電阻激光驅(qū)動(dòng)器-Interfacing Dig
Figure 4a. A laser bias current variation is implemented with a look-up table if an open-loop operation such as Figure 1a is used.

接口數(shù)控端口和電阻激光驅(qū)動(dòng)器-Interfacing Dig
Figure 4b. A peak-to-peak laser modulation current variation is implemented with a look-up table if an open-loop operation, such as Figure 2a, is used.

接口數(shù)控端口和電阻激光驅(qū)動(dòng)器-Interfacing Dig
Figure 4c. An integrated photodiode current variation is implemented with a look-up table if a closed-loop operation (APC), such as Figure 3a, is used.
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